Optoelectronic Sensory System for Raman Spectromicroscopes

In order to obtain a high microscopic and spectral resolution, both for the study spectrometric analysis carried out simultaneously at same area of sample, an adaptive optoelectronic system Raman spectromicroscopes with near-infrared excitation light source is designed. The current its working mode have major disadvantage due fact that sample moved several times from focusing lens radiation in search focal point ensure maximum resolution. this process, peak height Stokes spectrum monitored considered achieved when reaches maximum. Due energy density point, repeated searches may lead modification chemical composition investigated material and, some cases, even decomposition components. This paper presents advanced technical solution allows visible spectrum, as well rapid automatic analysis, wavelength 1064 nm domain without thermally affecting sample.